Simultaneously 2D Color Images and 3D Point Cloud

The 3Dpixa compact 15µm camera by Chromasens simultaneously acquires 2D color images and a 3D point clouds or depth maps. The camera is also able to detect overlapped chipsets or ones that are out of alignment, as it will show different colors on the depth map based on the height differences at line scan speeds of up to 310mm/s. The camera is equipped with a Tri-linear CCD Sensor (RGB) and provides optical resolution accuracy of 15µm/pixel over a large FoV (40mm). This allows users to check for micron-sized defects, such as scratches or dents, or to conduct further OCR on chipsets. The camera comes with the Chromasens 3D-API for software integration, and supports libraries from Halcon, MIL, Labview and Coake.

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Bild: Nikon Metrology GmbH
Bild: Nikon Metrology GmbH
Session 2: Inline Metrology

Session 2: Inline Metrology

Die Inline Metrology Session (Start 11:10 Uhr) startet mit Nikon (Laser Radar Metrology in EV Production), Micro-Epsilon (Inline 3D Measurements), bevor Eleven Dynamics (Universal Comaptibility with any Robot, Software & Sensor) und API Metrology (Efficiency through Integrated API Measurement Solutions for Automation) ihre Innovationen präsentieren.

Bild: TeDo Verlag GmbH
Bild: TeDo Verlag GmbH
Session 3: Surface Inspection

Session 3: Surface Inspection

Die Surface Metrology Session (Start 12:50 Uhr) umfasst Opto (Fast Anomaly detection on technical surfaces), Heliotis (3D inline sensor for inspection machines), Mahr (Modern surface measurement technology for hand use) sowie Precitec / Enovasense (Breakthrough in high resolution under surface analysis).