Session 3: Surface Metrology

Session 3 Surface Metrology inV Day Metrology 2025
Bild: TeDo Verlag GmbH

Um 12:30 Uhr startet Session 3 mit dem Thema ‚Surface Metrology‘. Die Vorträge hierzu halten das Fraunhofer IPM (Inline Roughness Measurement Using Laser Speckle Correlation), Mahr (Optosurf – Scattered Light Measurement for Roughness, Form and Waviness) und Bruker Alicona (One Click Roughness Measurements).